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Feature Selection for Trouble Shooting in Complex Assembly Lines

2007

Article

ei


The final properties of sophisticated products can be affected by many unapparent dependencies within the manufacturing process, and the products’ integrity can often only be checked in a final measurement. Troubleshooting can therefore be very tedious if not impossible in large assembly lines. In this paper we show that Feature Selection is an efficient tool for serial-grouped lines to reveal causes for irregularities in product attributes. We compare the performance of several methods for Feature Selection on real-world problems in mass-production of semiconductor devices. Note to Practitioners— We present a data based procedure to localize flaws in large production lines: using the results of final quality inspections and information about which machines processed which batches, we are able to identify machines which cause low yield.

Author(s): Pfingsten, T. and Herrmann, DJL. and Schnitzler, T. and Feustel, A. and Schölkopf, B.
Journal: IEEE Transactions on Automation Science and Engineering
Volume: 4
Number (issue): 3
Pages: 465-469
Year: 2007
Month: July
Day: 0

Department(s): Empirical Inference
Bibtex Type: Article (article)

Digital: 0
DOI: 10.1109/TASE.2006.888054
Language: en
Organization: Max-Planck-Gesellschaft
School: Biologische Kybernetik

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BibTex

@article{3611,
  title = {Feature Selection for Trouble Shooting
  in Complex Assembly Lines},
  author = {Pfingsten, T. and Herrmann, DJL. and Schnitzler, T. and Feustel, A. and Sch{\"o}lkopf, B.},
  journal = {IEEE Transactions on Automation Science and Engineering},
  volume = {4},
  number = {3},
  pages = {465-469},
  organization = {Max-Planck-Gesellschaft},
  school = {Biologische Kybernetik},
  month = jul,
  year = {2007},
  month_numeric = {7}
}